Technical indicators: interactive programming
All transfer control measurements are done by a visible front trigger or gpib. A number of storage methods are used to adjust and store parameters, including 370b non-receivable storage, built-in ms-dos compatible diskettes or external controllers。
Test kit
The test kit is a standard annex, which provides protection against the detector* to protect the surveyor by testing the adaptor a1001, the adaptor a1005 in the middle through kelvin, the 3 core adaptor without kemin and the surface adaptor a1023,1024
Characteristic curve icon
370b is a global, well-known, high-resolution characterization curve map that can be applied on many occasions. 370b completes the testing of straight-flow parameters for transistors, sniffers, diodes, controlled silicones, long-effect tubes, photoelectric elements, solar cells, solid-state displays and other semiconductors
In the research and development laboratory, the specific tests were reported using 370b tests, extraction of spec parameters, failure analysis and production data, and in the manufacturing process, the mass and process of the 370b test device was reported
Surveillance. 370b can perform a material check, the device performance tests fail, and the analysis and devices are matched to these tests.
