Semiconductor characterization grapher qt2 3-barrel low frequency straight flow parameters

Semiconductor tube characteristics grapher model: qt2

The qt2 semiconductor characterization grapher measures low-frequency direct flow parameters for two and three tubes, and z large-assembled electrical currents exceed 50a to meet the test for devices below 500va. This machine is equipped with a high-pressure detector device that allows two or three tubes below 5kv to be tested for penetration and reverse leakage computers. Its test current z can be as sensitive as 0. 5 μa/div。
Electro-scan
Three-barrel output voltage range current capacity
0-10v50a
20a (average)
0-50 v10a (average)
0 ~ 100 v5a (average)
0-500 v0. 5a (average)
2-0-5kv5ma
Base step signal
1 μa/step ~200ma/stage, 17-step
Step voltage 0. 05 v ~ 1 v/class, 5
Stairways normal (100%), pulse (10-40%)
Y-axis bias factor
1 μa/div ~5a/div, 21nd tranche
Two tubes 1 μa/div ~ 500 μa/div, in class 9
Multiplier x 0. 5
X-axis bias factor
10mv/div ~50v/div, 12th tranche
2-barrel 100v/div ~ 500v/div, in 3 tranches
General
10x10div (1div=0. 8cm)
Use of power supply ac220v/50hz
It's about 80 va
About 300 va (z power)
300b x 408h x 520dmm
Weight 30kg