I. What is a high-temperature probe tester
The high-temperature probe tester is a sophisticated laboratory equipment for electromechanical performance testing of semiconductors, integrated circuits, microelectronics and materials under severe temperature conditions. It enables rapid warming and stabilization of samples within wide temperatures through integrated heating and cooling systems, and provides a multifunctional testing platform for researchers and developers to simulate the actual working environment。
Ii. Working principles of the high-temperature probe tester 1
High-temperature probes are equipped with temperature control systems, usually consisting of heating and cooling units. Temperature sensors monitor ambient temperature in real time and feed the signal back to the controller, which accurately regulates the heating and cooling units through pid algorithms to achieve ±0. 2°c or even higher temperature accuracy。
2. Electrical performance test principles
The detector is placed on the probe and the probe is accurately exposed to the electrodes of the device through a high-precision positioning system. The temperature characteristics and reliability of a device are assessed by applying a telecommunications code and measuring electrical performance parameters such as electrical resistance, capacitation, current, voltage, etc. Of the device at different temperature conditions。
3. Environmental control
High-temperature probes can be equipped with vacuum or atmosphere control systems to prevent exposure during cryogenic tests, to prevent sample oxidation during high temperature tests and to ensure the accuracy of test results。
Iii. Main classification of the high temperature probe tester
Depending on functional and application areas, high-temperature probes can be divided into different types:
Vacuum high-temperature probes: high-temperature tests can be conducted in a vacuum environment, ranging from liquid helium temperature (approximately 4k) to high temperature (e. G. 475k), applicable to the electromechanical performance of materials under vacuum conditions。
Radio-frequency high-temperature probes: the radio-frequency test function is used to characterize the radio-frequency properties of semiconductors。
Optical high-temperature probes: a combination of optical microscopes and high-temperature tests allows for observation of sample microstructures and electrical performance tests at high-temperature conditions。
Iv. Core technical parameters of the high-temperature probe tester
When selecting a high-temperature probe, the following parameters require attention:
Temperature range: the temperature the equipment can provide, usually in °c or k
Temperature control accuracy: usually > 0. 2°c or better
Temperature stability: the ability to keep constant at set temperatures
Sample size: admissible sample size, 4 inches (100 mm) crystal circle
Number and type of probes: frequently equipped with 4 probes to support multi-channel electron measurements
V. Main area of application of the high-temperature probe tester: 1. Semiconductor device testing
In the semiconductor industry, high-temperature probes can be used to test the electrical properties of transistor tubes, diodes, integrated circuits, etc. At different temperatures, e. G., threshold voltage drift, leakage current changes, etc., and to assess the reliability and temperature adaptation of the equipment。
2. Material scientific research
To assess the performance of materials under harsh temperature conditions, such as thermal inflation factor, thermal conductivity, electrical resistance, etc., for the development of new materials and the improvement of existing materials。
3. Reliability testing of electronic components
The performance of many electronic components can change at high or low temperatures, and high-temperature probes can be used to assess the reliability and stability of electronic components under harsh temperature conditions。
Electronic car testing
Car electronic chips are required to work within the temperature range -40°c to +125°c, and high-temperature probes can simulate these harsh environments to ensure their reliability under various conditions。
5. Aerospace field
The reliability of chips is high in the aerospace field, which requires normal work at low and ultra-high temperatures, and high-temperature needles can be tested to simulate harsh temperature environments in space。
6. Hole effect test
Measurement of hole effects using high-temperature probes, study of electrical properties such as fluid type and concentration of materials。
Vi. Future trends in high-temperature probe testers
As the technology of integrated circuits continues to evolve, the high-temperature probes continue to upgrade:
1. Wider temperature range: from -75°c ~ + 200°c
2. Higher test accuracy: the test accuracy requirement increases as the size of the chip shrinks and performance increases
3. Multifunctional integration: integrated optical testing, radio frequency testing, etc. To meet diversity testing needs
Vii. Common faq question and answer q1: what is the difference between a high-temperature probe and a regular probe
A: the normal probe can only be tested in room temperature conditions, while the high-temperature probe is a heating and cooling system capable of conducting accurate temperature control tests in a temperature range ranging from -75°c to +200°c or even wider. It is capable of simulating the harsh temperature environment in which the chips are applied in practice. It assesses the electrical performance, reliability and stability of the units under different temperature conditions and is a test equipment in high reliability areas such as automobiles electronics, aerospace, etc。
Q2: what types of samples are applied to the high-temperature probe tester
A: high-temperature probes are suitable for various types of sample testing, including semiconductor devices (transistor tubes, diodes, integrated circuits), microelectronics, materials (e. G., quails, phase materials), photovoltaics, nanoscopes, etc. Samples may take the form of a whole crystal circle or a single chip after cutting。
Q3: how to ensure the accuracy of test data for high-temperature probes
A: ensuring the accuracy of the test data requires the following:
Maintaining the temperature of the target temperature for more than 30 minutes before measuring to ensure temperature stability
Second, regular calibration of temperature sensors, multi-point calibration using standard thermometers at sample locations
Thirdly, select appropriate probe materials and shapes to ensure good om contact with samples
Fourth, the use of shield cables and differential measurements of interference; regular check of vacuum or atmosphere to prevent exposure or oxidation of impact test results。
Q4: how is the temperature range of the high-temperature probe selected
A: the selection of temperature ranges shall be based on actual test needs:
General electrons device tests usually require -40°c to +150°c
Car electronic chips need to be tested within -40°c to +125°c
An aerospace vehicle may need a wider temperature range (e. G. -65°c to +200°c)
It is recommended that suitable temperature ranges be selected according to specific application scenarios and industry standards。
Q5: what is the role of the high temperature probe tester in semiconductor development
A: high-temperature probes play multiple roles in semiconductor development:
At the product design stage, verify that the performance of the chips at different temperatures meets the design requirements
In the manufacturing process, the long-term reliability of chips is assessed through temperature cycle tests, high temperature ageing tests, etc.
In case of failure analysis, assist engineers in locating and analysing temperature-related causes of temperature-related failures such as heat-borne fluid effects, electrical transport, etc.
In process optimization, the reasonableness of the process parameters is validated by testing data at different temperatures to increase the yield of chips。
The paper, which is organized and published in a non-tin crown, is intended to provide users with a source of expertise for the high-temperature probe tester. If we need more product information or technical programmes, we would be welcome to contact us for detailed information。
